ENTERASYS A4H124-24TX Redundant Ethernet System

The ENTERASYS A4H124-24TX dramatically reduces test time for applications that require intensive signal and data processing, such as RF protocol testing and hardware-in-the-loop (HIL) simulation. These applications can also replicate specific tests or processes, running on separate CPU cores and effectively doubling system throughput. 215,000,1K Fast Fourier Transforms (FFSTS) per second can be processed by the ENTERASYS A4H124-24TX, an example of its leading-edge performance, which is roughly 80 per cent faster than that of dual-core embedded controllers. Previously, this performance could only be achieved by using a large workstation.

The ENTERASYS A4H124-24TX is also available in a version that supports NSI real-time operation and the Lab Window/CVI real-time module, providing a flexible and robust platform for deterministic and real-time measurement and control. With a dual-core real-time system, engineers are limited to one CPU core to execute time-critical application segments, as the other cores are used to perform non-critical background services. With the new PXI-8110 quad-core embedded controller, engineers can allocate multiple CPU cores to run time-critical test segments while delegating non-critical services to the remaining cores.

This capability of the ENTERASYS A4H124-24TX helps engineers create robust real-time and deterministic systems.” Engineers and scientists rely on the performance and reliability of Product I to solve the world’s most challenging test, measurement and control applications. The new ENTERASYS A4H124-24TX quad-core embedded controller delivers on our commitment to provide engineers and scientists with advanced embedded computing solutions using high-performance processors such as the Intel Core 2 Quad processor.” By integrating the Intel Core 2 Quad processor in a compact 3U form factor, National Instruments is delivering the benefits of the Intel architecture to scientists and engineers who require more cores to create powerful and efficient parallel test and control systems.